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MTE1074W2-WRC

Name: Marktech Optoelectronics MTE1074W2-WRC
Brand: Marktech Optoelectronics
SKU: 193-MTE1074W2-WRC
Price: 12.73 EUR
Availability: OutOfStock

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Mouser No:

193-MTE1074W2-WRC

Mfr. No:

MTE1074W2-WRC

Mfr.:

Marktech Optoelectronics

Description:

Infrared Emitters 740nm IR Emitter TO-46 Flat Lens

Lifecycle:

New Product:

New from this manufacturer.

Datasheet:

MTE1074W2-WRC Datasheet (PDF)

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Learn more about Marktech Optoelectronics MTE1074W2-WRC

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Product Attribute	Attribute Value	Select Attribute
Manufacturer:	Marktech Optoelectronics
Product Category:	Infrared Emitters
RoHS:
Mounting Style:	Through Hole
Wavelength:	740 nm
Beam Angle:	90 deg
If - Forward Current:	20 mA
Vf - Forward Voltage:	1.9 V
Minimum Operating Temperature:	- 20 C
Maximum Operating Temperature:	+ 80 C
Brand:	Marktech Optoelectronics
Lens Shape:	Flat
Moisture Sensitive:	Yes
Product Type:	IR Emitters (IR LEDs)
Series:	SWIR
Factory Pack Quantity:	1
Subcategory:	Infrared Data Communications
Tradename:	SWIR Emitter

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Datasheet

MTE1074W2-WRC Datasheet (PDF)

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Origin Classifications

Country of Origin:: Not available
Assembly Country of Origin:: Not available
Country of Diffusion:: Not available

The country is subject to change at the time of shipment.

Short Wavelength Infrared Emitters

Marktech Optoelectronics Short Wavelength Infrared (SWIR) Emitters include both through-hole and surface-mount packages with wavelengths ranging from 1020nm to 1900nm. The SWIR emitters operate from 20mA to 350mA current range and are designed for high-power applications. These emitters consist of a high-output infrared die in a water-clear, 5mm plastic-molded package. Marktech Optoelectronics SWIR emitters offer high-speed light emission across spectral ranges not easily detected by standard detectors and are ideal for material and chemical analysis. Typical applications include optical switches, optical sensors, fiber-optic communication, biofluorescence and blood chemistry analysis, night vision, safety equipment, currency validation, fiber optics, and inspection systems.